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. 2021 Feb 8;11:3330. doi: 10.1038/s41598-021-82821-0

Figure 3.

Figure 3

In-situ XRD 2θ scans of a 3-layer-system from room temperature until 1520 °C. During this temperature increase (represented by thick blue line in the inset, which shows the whole annealing experiment) a tetragonal phase of HfO2 appears around 200 °C and later slowly disappears above 800 °C.