Table 2.
Summary of measurement qualities and instrumental properties
| Measurements (facts) | |||
|---|---|---|---|
| Quality | Quantity | Numerical value | Correction |
| Measurements precision | Random error | MV: σ, 2σ, 2σ/mean | – |
| Measurements trueness | Systematic error | Bias = AMV - R | – |
| Measurement accuracy | Measurement error | MV-R | – |
| Instruments (methods) | |||
|---|---|---|---|
| Property | Quantity | Numerical value | Correction |
| Instrumental precision | Random error | IV: σ, 2σ, 2σ/mean | Signal/noise |
| – | Systematic error | Bias = AIV-R | Zero, offset |
| Sensitivity | ΔIV/ΔR | Signal, gain | |
| Linearity | ΔIV/ΔR = constant | Signal, gain | |
| Resolution/step time response | Linked to SEM of IV | Signal, gain | |
MV measurement value, IV indication value, R reference value, A average, Δ change, SEM standard error of the mean