Table 4.
Comparison of the Bi–Te thin film properties and growth methods published in the literature (since year 2011) with the present work.
| References | Deposition method | Seebeck coefficient (µV/K) | Power factor (mW/m K2) |
|---|---|---|---|
| This work | Thermal evaporation | − 134 | 1.35 |
| Ref21 | Thermal evaporation | − 85 | 0.925 |
| Ref28 | Sputtering | − 85 | 1.14 |
| Ref34 | Sputtering | − 250 | 1.25 |
| Ref41 | Electrochemical deposition | − 58.3 | 0.35 |
| Ref27 | Sputtering | − 205 | 2.4 |
| Ref39 | Pulsed laser deposition | − 91 | 0.19 |
| Ref42 | Electrochemical deposition | − 110 | 1.093 |
| Ref26 | Sputtering | − 199 | 2.53 |
| Ref57 | MBE | − 182 | 0.9 |
| Ref24 | Sputtering | ~ − 140 | 1.1 |
| Ref29 | Sputtering | − 160 | 0.72 |
| Ref18 | Thermal evaporation | − 132 | 0.605 |
| Ref37 | Sputtering | − 150 | 1.125 |
| Ref31 | Sputtering | − 193 | 0.97 |
| Ref30 | Sputtering | ~ − 55 | 0.6 |
| Ref59 | Screen printing | − 138.4 | 0.192 |
| Ref35 | Sputtering | − 173 | 1.31 |
| Ref33 | Sputtering | − 92.4 | 0.709 |
| Ref32 | Sputtering | − 122 | 1.2 |
| Ref60 | Solution based synthesis | ~ −150 | 0.89 |
| Ref36 | Sputtering | − 50 | 1.145 |
| Ref19 | Thermal evaporation | ~ 200 | 1.020 |