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. 2021 Feb 19;12:938. doi: 10.1038/s41467-021-21193-5

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© The Author(s) 2021

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — a Distribution of the near-field signal intensity s(x,y) over the doped graphene near its edge, where the AGP interference fringes are visible. b High resolution s(x,y) scan of the graphene edge with AGP interference fringes. c Near-field signal intensity (blue solid) measured across the edge shown in (b) along the white dashed line (averaged over a ten-pixels-wide line), and calculated |E_z | at different carrier mobility in graphene (dashed) with E_F = −0.51 eV. d AGP fringes across the graphene edge in samples with spacer thickness t = 18 nm (blue) and 8 nm (black; fitted E_F = −0.49 eV). Inset: s(x,y) over the sample with t = 8 nm. All data is at ω = 1150 cm^–1.