Figure 4.
Global fits of a parallel pathways model to TH data for the WT and trapped-mutant G4s. TH datasets (295 nm) for the fully trapped (A), half-trapped (B) and WT (C) G4s. Fit residuals are shown in the subpanel below each dataset. Light to dark blue and orange to red indicate slowest to fastest annealing and melting scan rates, respectively. Experimental data are shown as colored circles, while optimized global fit data are colored lines.