Figure 2.

AFM height (A) and the corresponding modulus (B) image of ULC nanogels in situ adsorbed onto a PAH‐coated glass substrate in water at T=27 °C at the same position as in Figure 1 E. Images were obtained from Force Volume measurements. I‐V: Force‐distance curves at the five positions as indicated in the images (A and B). The curves were first‐order baseline corrected and shifted by the contact point. The applied force for imaging of F=300 pN (force threshold) is marked as well as the contact point and the tip‐sample‐distance, at which the force threshold is reached. The difference in distances is visualized by an arrow and corresponds to the indentation depth into the nanogel, by which the visualized height has to be corrected.