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. 2021 Jan 22;12(2):115. doi: 10.3390/mi12020115

Figure 1.

Figure 1

Implications of blurred electron beams on inclination ζ during 3D- focused electron beam induced deposition (FEBID). ζ is plotted as function of dwell time/patterning velocity for in-focus conditions and blurred electron beams at 5 keV/28 pA. The shaded areas indicate constant vertical growth rates (see main text).