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. 2021 Feb 1;11(2):348. doi: 10.3390/nano11020348
MFM Magnetic force microscopy
SSQM Scanning SQUID microscopy
SHPM Scanning Hall probe microscopy
GFM Granular ferromagnet
OHE Ordinary Hall effect
EHE Extraordinary Hall effect
FEBID Focused electron beam induced deposition
GIS Gas injection system
SEM Scanning electron microcope
EDX Energy-dispersive X-ray spectroscopy
AFM Atomic force microscopy