AFM	Atomic force microscopy
AGM	Alternating gradient magnetometery
Cryo-TEM	Cryogenic transmission electron microscopy
DCS	Differential centrifugal sedimentation
DLS	Dynamic light scattering
EBSD	Electron backscatter diffraction
EDX	Energy dispersive X-ray spectroscopy
EELS	Electron energy loss spectroscopy
EXAFS	Extended X-Ray absorption fine structure
EPM	Electrophoretic mobility
EPLS	Elliptically polarized light scattering
FMR	Ferromagnetic resonance
FTIR	Fourier Transform Infrared Spectroscopy
HRTEM	High resolution transmission electron microscopy
ICP-OES	Inductively coupled plasma optical emission spectrometry
ICP-MS	Inductively coupled plasma mass spectrometry
ICP-AES	Inductively coupled plasma atomic emission spectroscopy
ILP	Induced loss power
IONPs	Iron oxide nanoparticles
LEIS	Low-energy ion scattering
MALDI	Matrix-assisted laser desorption/ionisation
MH	Magnetic Hyperthermia
MFM	Magnetic force microscopy
MNPs	Magnetic Nanoparticles
MRI	Magnetic resonance imaging
NMR	Nuclear magnetic resonance
NTA	Nanoparticle tracking analysis
PTA	Particle tracking analysis
RMM-MEMS	Resonant mass measurement microelectro-mechanical system
SANS	Small angle neutron scattering
SAR	Specific absortion rate
SAXS	Small angle X-ray scattering
SEM	Scanning electron microscopy
SEM-EDX	Scanning electron microscopy - Energy dispersive X-ray spectroscopy
SIMS	Secondary ion mass spectrometry
SLP	Specific loss power
SOP	Standard operating procedure
STEM	Scanning transmission electron microscopy
SQUID	Superconducting quantum interference device
TEM	Transmission electron microscopy
TGA	Thermogravimetric analysis
TRPS	Tunable resistive pulse sensing
UV-vis	Ultraviolet–visible spectroscopy
VSM	Vibrating sample magnetometry
XRD	X-Ray diffraction
XMCD	X-Ray magnetic circular dichroism
XPS	X-Ray photoemission spectroscopy