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. 2021 Feb 9;12(2):172. doi: 10.3390/mi12020172

Figure 16.

Figure 16

Creeping and load cycle test. (a) Between the shown deformation measurements, the devices were loaded with sinusoidal voltage cycles between 0 and 70 V (b) Deformation before and after about 1 Mio. cycles (0–70 V).