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. 2021 Feb 9;12(2):172. doi: 10.3390/mi12020172

Table 3.

Creeping and stress cycle measurement results.

Number of Cycles Total Chip Deformation (µm) Membrane Deformation (µm)
Run1 0 4.779 2.505
300 4.737 2.490
3000 4.755 2.497
6000 4.763 2.506
Run2 0 3.402 2.024
1,080,000 3.729 2.221