Figure 15.

Relative number (or “crater probability”) of hits causing a strongly negative signal (<−5 × pixel noise) depending on the interaction point in the pixel under investigation for different pixels in the direct neighborhood. The directly adjacent pixels (R/U/L) exhibit high probabilities close to 100%, when photons are deposited close to the readout electrode. The crater probability drops close to the pixel boundaries (at ±37.5 μm) due to enhanced charge sharing. Note: Compared to Figure 14, where the pixel response is shown as function of absorption position in the pixel itself, this plot indicates the pixel response of a pixel in the vicinity of the irradiated pixel as function of the absorption position within the pixel which is being irradiated.