Table 1. Rietveld refinement of NaOEt in P4/nmm and P 2₁ m under identical conditions, with restrained H-atom positions and a 2θ range of 2–60°.

The values marked by a ′ are background-subtracted values. N(param) is the number of structural parameters, including the occupancy parameter.

	P4/nmm	P 21 m	P 21 m with both orientations of Et
R wp (%)	4.320	4.146	4.149
R wp′ (%)	16.98	16.30	16.30
R p (%)	3.205	3.122	3.126
R p′ (%)	18.21	17.74	17.75
Goodness-of-fit	2.016	1.935	1.936
N(param)	13	13	13 + 1 (occupancy)
Occupancy of the ethyl group	0.25 (fixed)	0.5 (fixed)	0.476 (6):0.024 (6)