Table 4. Rietveld refinement of NaOnBu and NaOnAm in P4/nmm and P
21
m under identical conditions, with restraints on the C and H atoms.
N(param) is the number of structural parameters, including the occupancy parameter.
| NaOnBu | NaOnAm | |||
|---|---|---|---|---|
| P4/nmm |
P
21
m
|
P4/nmm |
P
21
m
|
|
| R wp (%) | 4.620 | 4.884 | 5.403 | 5.762 |
| R wp′ (%) | 18.52 | 19.30 | 15.87 | 17.03 |
| R p (%) | 3.578 | 3.766 | 3.875 | 4.071 |
| R p′ (%) | 18.73 | 19.11 | 12.44 | 13.13 |
| Goodness-of-fit [S] | 1.924 | 2.032 | 1.974 | 2.106 |
| N(param) | 23 | 23 | 28 | 28 |