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. 2021 Feb 1;54(Pt 1):7–21. doi: 10.1107/S1600576720013989

Figure 2.

Figure 2

Overview of XBI characterization techniques for analysis of nano/microcrystals and particles of different types. EM – electron microscopy, AFM – atomic force microscopy, DLS – dynamic light scattering, SEC-HPLC – size-exclusion chromatography, high-performance liquid chromatography, AUC – analytical ultracentrifugation, native MS – native mass spectrometry, NTA – nanoparticle tracking analysis, FACS – fluorescence-activated cell sorting.