Skip to main content
. 2021 Feb 1;54(Pt 1):280–286. doi: 10.1107/S1600576720015885

Table 3. The 〈ρ*〉 formal dislocation-density values obtained for the E110 samples irradiated with fluences 1.99 × 1024 nm−2 (low fluence) and 3.2 × 1024 nm−2 (high fluence).

Values obtained from the v 2(q) and v 4(q) restricted moments are given.

〈ρ*〉 (1014 m−2) v 2 (0002) v 4 (0002) v 2 Inline graphic v 4 Inline graphic
Low fluence 8.5 8.1 23 21
High fluence 6.7 6.5 15 12