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. 2021 Feb 1;54(Pt 1):32–41. doi: 10.1107/S1600576720014508

Table 1. Parameters used for the XSA experiments with the MetalJet X-ray source.

Source Liquid metal jet, 160 kV/1.56 mA (250 W), effective focus 20 × 20 µm
Optics (primary beam) Polycapillary lens (f 2 = 900 mm, δ = 0.26°); exit beam cross section defined by pinholes with diameters 0.2 and 2.0 mm
Optics (diffracted beam) Equatorial Soller slit (δ = 0.15°) + 1.0 mm entrance slit
Detector Ge semiconductor detector (Canberra model GL0110); resolution: 160 eV at 10 keV and 420 eV at 100 keV
XSA mode Symmetrical Ψ mode (ψ = −63°…63°), Δ(sin2ψ) = 0.05
Diffraction angle 2θ = 16.3°
Integration time 300 s (∅ = 2 mm), 3600 s (∅ = 0.2 mm)
Calibration measurement Stress-free W powder, applied at the measuring point and analyzed under identical conditions
Data evaluation MATLAB-based software package EDDIDAT (Apel et al., 2020)