Table 1. Parameters used for the XSA experiments with the MetalJet X-ray source.
| Source | Liquid metal jet, 160 kV/1.56 mA (250 W), effective focus 20 × 20 µm |
| Optics (primary beam) | Polycapillary lens (f 2 = 900 mm, δ = 0.26°); exit beam cross section defined by pinholes with diameters 0.2 and 2.0 mm |
| Optics (diffracted beam) | Equatorial Soller slit (δ = 0.15°) + 1.0 mm entrance slit |
| Detector | Ge semiconductor detector (Canberra model GL0110); resolution: 160 eV at 10 keV and 420 eV at 100 keV |
| XSA mode | Symmetrical Ψ mode (ψ = −63°…63°), Δ(sin2ψ) = 0.05 |
| Diffraction angle | 2θ = 16.3° |
| Integration time | 300 s (∅ = 2 mm), 3600 s (∅ = 0.2 mm) |
| Calibration measurement | Stress-free W powder, applied at the measuring point and analyzed under identical conditions |
| Data evaluation | MATLAB-based software package EDDIDAT (Apel et al., 2020 ▸) |