. 2021 Feb 1;54(Pt 1):203–210. doi: 10.1107/S1600576720015472

Table 1. Size of coherent scattering crystallites d _coh, island density ρ and root mean square roughness σ_RMS from XRR and AFM of 200 Å thin CuPc films grown at two different substrate temperatures (T _sub).

T _sub (K)	d _coh (nm)	ρ (µm²)	σ_RMS, XRR (nm)	σ_RMS, AFM (nm)
310	21	400	2.9	2.7
400	31	40	1.8	1.7

Table 1. Size of coherent scattering crystallites d coh, island density ρ and root mean square roughness σRMS from XRR and AFM of 200 Å thin CuPc films grown at two different substrate temperatures (T sub).