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. 2021 Mar 7;10(5):1118. doi: 10.3390/jcm10051118

Figure 2.

Figure 2

Kaplan–Meier cumulative incidence curve for failure (defined as the requirement of secondary surgery (A) and according to WGA-criteria (B)) of XEN-implant as a standalone (XEN only) vs. as a combined (XEN + CE) procedure during follow-up. Censored patients are denoted by vertical tick marks. The shade around the curve represents the confidence intervals for the point estimates of the curve.