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. 2021 Feb 2;60(9):4640–4647. doi: 10.1002/anie.202014331

Figure 4.

Figure 4

Post‐OER (CA 24 h) analysis of fully elecrooxidized NiGe. a) TEM image showing porous‐type morphology, b) HR‐TEM image with the lattice fringes (inset) of 0.23 nm corresponding to (102) plane of γ‐NiOOH (JCPDS 6‐75), c) Ni 2p XPS spectrum displaying complete oxidation of Ni0 (NiGe) to NiIII (γ‐NiOOH), and d) Ge 3d XPS confirming the exclusion of Ge from the NiGe structure.