Table 2.
Coincidence resolution time (FWHM)
| KETEK | SensL | Hamamatsu | |
|---|---|---|---|
| PA3325-WB-0808 | Array-J-30020-64P-PCB | S14161-3050-HS-08 | |
| Threshold vth_t1 | |||
| 10 | 273.8±0.7 ps | 265.2±0.6 ps | 224.1±0.7 ps |
| 20 | 271.4±0.7 ps | 265.4±0.6 ps | 221.2±0.7 ps |
| 30 | 268.6±0.7 ps | 263.7±0.6 ps | 221.1±0.7 ps |
| 40 | 266.1±0.6 ps | 262.8±0.6 ps | 219.9±0.7 ps |
| 50 | 264.6±0.6 ps | 262.4±0.6 ps | 220.0±0.7 ps |
| Segmentation layer | |||
| BaSO4 (360 µm) | 264.6±0.6 ps | 262.4±0.6 ps | 220.0±0.7 ps |
| BaSO4 (110 µm) | 282.8±0.6 ps | 306.5±0.6 ps | 242.9±0.5 ps |
| ESR (67 µm, glued) | 371.4±0.8 ps | 463.4±0.8 ps | 328.1±0.7 ps |
| Distance | |||
| 18 mm | 277.3±0.4 ps | - | - |
| 38 mm | 264.6±0.6 ps | 262.4±0.6 ps | 220.0±0.7 ps |
| 58 mm | 245.3±0.8 ps | 253.3±0.8 ps | 224.4±0.7 ps |
| Clinical (19 mm height) | |||
| ESR (155 µm, air-coupled) | 317.3±1.9 ps | 325.1±1.7 ps | 247.5±2.4 ps |
Parameter study for multi-channel configurations featuring SiPMs by different vendors. Table reports the lowest CRT achieved in coincidence measurements of two times 64 channels with the corresponding settings and materials used. If not indicated differently, data were acquired at vth_t1=50, vth_t2=20, vth_e=15, with 360 µm BaSO4 for scintillator segmentation, a scintillator height of 12 mm, and at a distance of 38 mm. The overvoltage setting varies according to the parameter setting and SiPM type used. For the clinical configuration (19-mm high scintillator), only two times 16 channels were read out