Table 3.
Coincidence resolution time (FWTM) and Gaussian excess factors gaussexc
| KETEK | SensL | Hamamatsu | ||||
|---|---|---|---|---|---|---|
| PA3325-WB-0808 | Array-J-30020-64P-PCB | S14161-3050-HS-08 | ||||
| CRT (FWTM) | gaussexc | CRT (FWTM) | gaussexc | CRT (FWTM) | gaussexc | |
| Threshold vth_t1 | ||||||
| 10 | 524.6 ps | 5.07% | 528.9 ps | 9.38% | 424.1 ps | 3.80% |
| 20 | 514.2 ps | 3.89% | 514.6 ps | 6.34% | 420.1 ps | 4.13% |
| 30 | 511.4 ps | 4.40% | 517.2 ps | 7.56% | 416.7 ps | 3.36% |
| 40 | 501.6 ps | 3.40% | 504.3 ps | 5.22% | 417.0 ps | 4.02% |
| 50 | 503.6 ps | 4.39% | 507.7 ps | 6.12% | 416.4 ps | 3.82% |
| Segmentation layer | ||||||
| BaSO4 (360 µm) | 503.6 ps | 4.39% | 507.7 ps | 6.12% | 416.4 ps | 3.82% |
| BaSO4 (110 µm) | 542.6 ps | 5.23% | 604.9 ps | 5.29% | 464.9 ps | 4.97% |
| ESR (67 µm, glued) | 715.1 ps | 5.61% | 896.7 ps | 6.13% | 609.6 ps | 8.37% |
| Distance | ||||||
| 18 mm | 539.6 ps | 6.71% | - | - | - | - |
| 38 mm | 503.6 ps | 4.39% | 507.7 ps | 6.12% | 416.4 ps | 3.82% |
| 58 mm | 463.8 ps | 3.68% | 477.2 ps | 3.32% | 419.9 ps | 2.64% |
| Clinical (19 mm height) | ||||||
| ESR (155 µm, air-coupled) | 601.9 ps | 4.04% | 617.2 ps | 4.11% | 462.3 ps | 2.43% |
Parameter study for multi-channel configurations featuring SiPMs by different vendors. Table reports the CRT (FWTM) and Gaussian excess factors corresponding to the lowest CRTs achieved in coincidence measurements of two times 64 channels (see Table 2). If not indicated differently, data were acquired at vth_t1=50, vth_t2=20, vth_e=15, with 360 µm BaSO4 for scintillator segmentation, a scintillator height of 12 mm, and at a distance of 38 mm. The overvoltage setting varies according to the parameter setting and SiPM type used. The error on the reported CRTs (FWTM) is less than 0.1 ps. For the clinical configuration (19-mm high scintillator), only two times 16 channels were read out