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. 2021 Mar 12;14(6):1375. doi: 10.3390/ma14061375
CBN Cubic boron nitride
CD Crystal diamond
CSGW Cutting surface of gringing wheel
ECDGW-AC Electrochemical dressing of suparhard grinding wheels using alternating current
SD Synthetic diamond
ES Electrolyte solution of specially selected chemical compounds
a Depth of grinding, mm
D Grinding wheel external diameter, mm
DGW Equivalent grinding wheel diameter, mm
E Total overpotential, V
HN Kinematic cutting edges, µm
k Coefficient of “simulation of the grinding process”
kv Coefficient of electrochemical workability of the grinding wheel components, mm3A−1mm−1
le Distance between electrodes, mm
LN Distance between kinematic edges, mm
Re Resistance of electrolyte, Ω
RGW Resistance of grinding wheel, Ω
S Thickness of inter-electrode gap, mm
∑SN Static cutting edges, mm−1
SGW Surface of grinding wheel
ti Time of start of digestion process, min
to Actual time of dressing, min
toe Effective time of dressing, min
TN Average maximum thickness of a chip, µm
Tn Time of dressing needed for the removal of the grinding wheel layer, min
Ue Effective value voltage of the inter-electrode gap, V
Vdig Speed of digestion, mms−1
Vf Speed of longitudinal feed, ms−1
VGW Speed of grinding wheel, ms−1
Z¯ Average depth of deposition of the static edges, µm
χ Specific conductance of the electrolyte, Sm−1
ε Face run-out, µm
ΔH Thickness of the grinding wheel layer removed in the ECDGW-AC process, µm.