| CBN |
Cubic boron nitride |
| CD |
Crystal diamond |
| CSGW |
Cutting surface of gringing wheel |
| ECDGW-AC |
Electrochemical dressing of suparhard grinding wheels using alternating current |
| SD |
Synthetic diamond |
| ES |
Electrolyte solution of specially selected chemical compounds |
|
a
|
Depth of grinding, mm |
|
D
|
Grinding wheel external diameter, mm |
|
DGW
|
Equivalent grinding wheel diameter, mm |
|
E
|
Total overpotential, V |
|
HN
|
Kinematic cutting edges, µm |
|
k
|
Coefficient of “simulation of the grinding process” |
|
kv
|
Coefficient of electrochemical workability of the grinding wheel components, mm3A−1mm−1
|
|
le
|
Distance between electrodes, mm |
|
LN
|
Distance between kinematic edges, mm |
|
Re
|
Resistance of electrolyte, Ω |
|
RGW
|
Resistance of grinding wheel, Ω |
|
S
|
Thickness of inter-electrode gap, mm |
|
∑SN
|
Static cutting edges, mm−1
|
|
SGW
|
Surface of grinding wheel |
|
ti
|
Time of start of digestion process, min |
|
to
|
Actual time of dressing, min |
|
toe
|
Effective time of dressing, min |
|
TN
|
Average maximum thickness of a chip, µm |
|
|
Time of dressing needed for the removal of the grinding wheel layer, min |
|
Ue
|
Effective value voltage of the inter-electrode gap, V |
|
Vdig
|
Speed of digestion, mms−1
|
|
Vf
|
Speed of longitudinal feed, ms−1
|
|
VGW
|
Speed of grinding wheel, ms−1
|
|
|
Average depth of deposition of the static edges, µm |
|
χ
|
Specific conductance of the electrolyte, Sm−1
|
|
ε
|
Face run-out, µm |
|
ΔH
|
Thickness of the grinding wheel layer removed in the ECDGW-AC process, µm. |