Figure 3.
(a) Grazing incidence XRD for Y2O3:Eu and ZnS samples grown by ALD on Si substrates, (*) marks traces of monoclinic phase. The Y2O3:Eu sample was prepared with a 3:2 cycle ratio. (b) XRD spectrum for the ZnS sample measured in in-plane measurement mode. (c) XRD spectrum for the ZnS sample in the 2θ-ω measurement mode.