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. 2021 Feb 25;9(4):2169–2179. doi: 10.1002/fsn3.2187

FIGURE 2.

FIGURE 2

The AFM micrographs of SiO2‐free SSPS (a), SSPS/SiO2 (1%) (b), SSPS/SiO2 (3%) (c), and SSPS/SiO2 (5%) (d)