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. 2021 Mar 18;5(4):e10425. doi: 10.1002/jbm4.10425

Table 2.

Energy‐Dispersive X‐Ray Spectroscopy Analysis of Atomic Surface Composition of SiON, SiONP1, and SiONP2 Coating

EDS compositional data (at %)
Sample Si O N P
SiONx 52.5 35.1 12.3 0
SiONPx1 61.8 7.3 30.5 0.28
SiONPx2 58.7 14.2 26.8 0.27

EDS Compositional data in units of (at %).

EDS = Energy‐dispersive X‐ray spectroscopy; SiON = silicon oxynitride; SiONP = silicon oxynitrophosphide.