. Author manuscript; available in PMC: 2021 Jun 1.

Published in final edited form as: Nat Protoc. 2020 May 13;15(6):2041–2070. doi: 10.1038/s41596-020-0320-x

Table 2 ∣.

Image acquisition settings for SEM and FIB during sample preparation

	Live (FIB/SEM)	Snapshot (SEM only)	Photo (SEM only)
Dwell Time	200 ns	200 ns	1 to 2 μs
Line integration	1	1	1
Resolution	1536 x 1024	3072 x 2048	6144 x 4096
Bit Depth	8	8	8

A live feed is used to monitor the milling process at FIB and SEM view. For the recording purposes of milling, SEM/FIB image snapshot setting is used. Photo setting is used only for recording purpose of low2 magnification image covering a whole grid due to the high electron dose. FIB imaging should be minimized due to the non-targeted sample damaging by FIB.