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. 2021 Apr 20;12:2348. doi: 10.1038/s41467-021-22527-z

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© The Author(s) 2021

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 3 — a In situ sXRD of Li_1.2Ni_0.4Ru_0.4O₂, the black pattern at the bottom is the background from the in situ cell; cell was cycled between 4.8 and 2.5 V at C/10. b sXRD of Li_xNi_0.4Ru_0.4O₂ (x = 1.2, 0.5, 0.2, 0) prepared by chemical delithiation method. c Joint refinement of sXRD and ND patterns of Li_0.2Ni_0.4Ru_0.4O₂. Critical reflections are indexed as (hkl)_L and (hkl)_R for R $\bar{3}$ m and Fm $\bar{3}$ m, respectively.