| Rigaku Pilatus 200K diffractometer | 3181 independent reflections |
| Radiation source: fine-focus sealed X-ray tube, Enhance (Cu) X-ray Source | 3160 reflections with I > 2σ(I) |
| Graphite monochromator | Rint = 0.013 |
| Detector resolution: 5.8140 pixels mm-1 | θmax = 74.2°, θmin = 5.7° |
| profile data from ω–scans | h = −9→11 |
| Absorption correction: multi-scan (CrysAlisPRO; Rigaku OD, 2019) | k = −11→13 |
| Tmin = 0.573, Tmax = 1.000 | l = −19→19 |
| 6660 measured reflections |