| MOSFET | Metal-oxide-semiconductor field effect transistors |
| SPR | Surface plasmon resonance |
| rGO | Reduced graphene oxide |
| CNTs | Carbon nanotubes |
| 2D | Two-dimensional |
| 3D | Three-dimensional |
| TMDCs | Transition metal dichalcogenides |
| MOx | Metal oxides |
| VOCs | Volatile organic compounds |
| e-noses | Electronic noses |
| FFT | Fast Fourier transform |
| CWT | Continuous wavelet transform |
| DWT | Discrete wavelet transform |
| PCA | Principal component analysis |
| LDA | Linear discriminant analysis |
| KNN | k-nearest neighbors |
| CART | Classification and regression trees |
| NB | Gaussian naïve Bayes |
| SVM | Support vector machines |
| RF | Random forest |
| DFT | Density function theory |
| DOS | Density of state |
| VSCs | Volatile sulfur compounds |
| LOD | Limit of detection |
| LPWN | Low-power wireless network |
| M2M | Machine to machine |
| LR | Logistic regression |
| Rair | Sensor resistance in air |
| Rgas | Sensor resistance after gas exposure |
| ΔR | Difference between Rair and Rgas |
| AResp | Area under response time curve |
| ARecov | Area under recovery time curve |
| Cavitand | A container shaped molecule with a cavity |
| Tsfresh | A tool for feature extraction |
| FETs | Field effect transistors |
| CV | Cross-validation |
| ANN | Artificial neural networks |
| DFA | Discriminant factor analysis |
| MEMS | Micro-electromechanical systems |
| NEMS | Nano-electromechanical systems |