Table 1. Comparisons of the ADPs of Si between the present study and previous reports.

All the values in the table are shown in units of 10⁻⁴ Ų, unless stated otherwise. INS and CBED stand for inelastic neutron scattering and convergent-beam electron diffraction, respectively.

Temperature (K)	PXRD from OHGI (Present study)	PXRD from AVID #1 (Wahlberg et al., 2016 ▸)	PXRD from AVID #2 (Tolborg et al., 2017 ▸ )	INS (Flensburg & Stewart, 1999 ▸)	CBED (Sang et al., 2010 ▸)
100	29.7 (2)	31.81†	33.70†	—	34 (2)
300	57.7 (3)	56.20†	61.03†	59.41 (21)	61 (1)

^†Standard deviations were not reported.