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. 2021 Apr 13;8(Pt 3):444–454. doi: 10.1107/S2052252521002852

Table 1. Sputtering target, substrate temperature T sub, film composition and measurements for all the thin-film samples.

NI and GI denote normal incidence and grazing incidence, respectively. The notations s1 and s2 mean two identical thin-film samples, and p1 and p2 mean two half pieces from one film sample.

Film sample Target T sub Film composition (at%) Measurement
Zn Sb Ag
ZSA1_RT Ad1 RT 55.3 (6) 42.4 (5) 2.3 (1) XRD
ZSA1_ 373K Ad1 373 K Near identical to ZSA1_RT XRD
ZSA1_423K Ad1 423 K Near identical to ZSA1_RT (p1) XRD + (p2) GI-PDF
ZSA1_473K Ad1 473 K Near identical to ZSA1_RT XRD
ZSA2 (s1) Ad2 RT 42.8 (4) 55.0 (5) 2.2 (1) XRD
ZSA2 (s2) Ad2 RT 43.2 (4) 54.5 (3) 2.3 (1) GI-PDF
ZSA3 (s1) Ad3 RT 42.8 (3) 54.6 (2) 2.5 (1) XRD
ZSA3 (s2) Ad3 RT Near identical to ZSA3 (s1) GI-PDF
ZS1 Ud1 RT 46.6 (4) 53.4 (4) XRD
ZS2 (s1) Ud2 RT 39.8 (5) 60.2 (5) XRD
ZS2 (s2) Ud2 RT 39.3 (3) 60.7 (3) NI-PDF with resistivity
ZS3_373K Ud3 373 K 51.5 (2) 48.5 (2) NI-PDF with resistivity
ZS3_RT Ud3 RT 50.9 (2) 49.1 (2) XRD