Skip to main content
. 2021 Apr 13;8(Pt 3):444–454. doi: 10.1107/S2052252521002852

Table 2. Experimental conditions of the in situ XRD measurements for the thin-film samples.

Film sample Temperature profile Environment
ZSA1_373K {\rm RT} \mathop \to \limits^{{\rm{10\,K\,min}}^{-1}} 473\,{\rm K}\mathop \to \limits^{{\rm{1\,K\,min}}^{-1}}673\,{\rm K}\mathop \to \limits^{{\rm{1\,h}}}673\,{\rm K}\mathop \to \limits^{{\rm{2\,K\,min}}^{-1}}310\,{\rm K} Air
 
ZSA1_RT {\rm RT} \mathop \to \limits^{{\rm{2\,K\,min}}^{-1}} 573\,{\rm K}\mathop \to \limits^{{\rm{2\,h}}}573\,{\rm K}\mathop \to \limits^{{\rm{2\,K\,min}}^{- 1}}{\rm RT} Air
ZSA1_423K (p1)
ZSA1_473K
ZSA2 (s1)
ZSA3 (s1)
 
ZS1 {\rm RT}\mathop \to \limits^{{\rm{2\,K\,min}}^{- 1}}506\,{\rm K}\mathop \to \limits^{{\rm{2\,h}}}506\,{\rm K}\mathop \to \limits^{{\rm{2\,K\,min}}^{- 1}}{\rm RT} Air
 
ZS2 (s1) {\rm RT}\mathop \to \limits^{{\rm{1\,K\,min}}^{{\rm{ - 1}}}}573\,{\rm K}\mathop \to \limits^{{\rm{1\,h}}}573\,{\rm K}\mathop \to \limits^{{\rm{15\,K\,min}}^{- 1}}{\rm RT} Dynamic vacuum
 
ZS3_RT {\rm RT}\mathop \to \limits^{{\rm{20\,K\,min}}^{- 1}}473\,{\rm K}\mathop \to \limits^{{\rm{1\,K\,min}}^{- 1}}573\,{\rm K}\mathop \to \limits^{{\rm{1\,h}}}573\,{\rm K}\mathop \to \limits^{{\rm{15\,K\,min}}^{- 1}}{\rm RT} Dynamic vacuum