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. 2021 Apr 30;7(18):eabg3749. doi: 10.1126/sciadv.abg3749

Fig. 3. Crystal structure of intermediate films and surface morphology evolutions of the perovskite films.

Fig. 3

(A to C) XRD characterization of three precursor wet films immersed into antisolvent at different time stages for 2 min without annealing treatment. (A) DMF, (B) DMF-NMP, and (C) DMF-NMP-DPSO. (D) Scanning electron microscopy (SEM) images of precursor films (DMF, DMF-NMP, and DMF-NMP-DPSO are denoted as precursors 1, 2, and 3, respectively) immersed into antisolvent at different wet film holding time stages for 2-min AST and annealed at 150°C for 30 min. “W/o AST” represents the films that are directly heated (150°C for 30 min) after coating. Scale bar, 1 μm.