Fig. 3. Heusler/graphene/sapphire interface.

a, b STEM image of the GdPtSb/graphene/Al₂O₃ interface for the two different GdPtSb domains, as viewed along the ${⟨11\overline{2}0⟩}_{\mathrm{A}{\mathrm{l}}_{\mathrm{2}}{\mathrm{O}}_{\mathrm{3}}}$ zone axis. We used log scale false-color image to simultaneously visualize the film and substrate for better contrast. The insets show the schematic crystal structures and fast Fourier transforms of the STEM images. c In-plane ϕ scan of GdPtSb 220 reflections and Al₂O₃ 10$\overline{1}$4 reflections for GdPtSb sample grown on graphene/Al₂O₃. Δϕ = ±30° are the in-plane angles between the 〈101〉 direction of GdPtSb and the $⟨11\overline{2}0⟩$ direction of Al₂O₃ substrate.