Skip to main content
. 2021 Mar 3;8(9):2004313. doi: 10.1002/advs.202004313

Figure 1.

Figure 1

a) CZTSe bandgap versus the annealing temperature during the annealing/quenching condition. Inset: Tauc's plots for direct bandgap for lowering temperature. Reproduced with permission.[ 73 ] Copyright 2014, AIP Publishing LLC. b) Schema of defect and defect cluster states for the absorber annealed above critical temperature, with fast cooling, and with slow cooling rate, respectively. The defect formation energy selected from ref. [ 29 ]. c) CZTSSe bandgap shifts induced by slow and rapid cooling rate. Reproduced with permission.[ 69 ] Copyright 2014, AIP Publishing LLC. d) Diagram of E g–PL versus bandgap estimated from EQE, showing degree of band tail as function of ordering–disordering. The data are selected from refs. [ 41 , 68 , 166 , 167 ].