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. 2021 Apr 26;21(9):3027. doi: 10.3390/s21093027
AFM Atomic Force Microscope
DLS Dynamic Light Scattering
DoF Degrees of Freedom
HPS Horizontal Positioning System
LMFM Lateral Molecular Force Microscope
NMR Nuclear Magnetic Resonance
NSOM Near-field Scanning Optical Microscope
PSD Power Spectrum Density
SEW Scattered Evanescent Wave
SPM Scanning Probe Microscope
STM Scanning Tunneling Microscope
TIRF Total Internal Reflection Fluorescence
VOP Vertically Oriented Probe
VPS Vertical Positioning System