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. 2020 Jan 1;76(Pt 1):92–109. doi: 10.1107/S2053273319015304

Figure 2.

Figure 2

|F th(h)| − |F model(h)| versus resolution [sin θ/λ (Å−1), d (Å)] for the IAM and TAAM models applied to the target crystal structure: (top) electron |F(h)| (Å), (bottom) X-ray |F(h)| (e). |F(h)| were computed using the target atomic positions and thermal parameters (dynamic) or with target atomic positions only (static).