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. 2020 Jan 1;76(Pt 1):92–109. doi: 10.1107/S2053273319015304

Figure 6.

Figure 6

Overall R1 agreement factors (%) for structure refinements with experimental (xSFex) or theoretical (xSFth) X-ray diffraction data sets truncated to various resolutions (d min = 0.8, 0.6, 0.4 Å) using various scattering models (xIAM, xTAAM) and sets of refined parameters (options 1, 2, 3 or 4).