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. 2021 May 7;11(5):1230. doi: 10.3390/nano11051230

Figure A3.

Figure A3

Results of the angle-resolved XPS measurements of the graphene transferred onto SiO2/Si substrate. Decomposition of C1s (a) and O1s (b) core level signals into their constituents. Take-off angle (measured from the sample surface) increases from 10° to 70°; correspondingly, the explored depth of the sample is increased.