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. 2021 Apr 2;37(14):4064–4071. doi: 10.1021/acs.langmuir.0c03235

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© 2021 The Authors. Published by American Chemical Society

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Upper left panel: NR () plotted as a function of Q_z for FF25 (5 vol %) measured against hydrophilic (piranha), hydrophobic (OTS), and APTES-coated Si. The solid lines represent fits to the data. Other panels: profile of nuclear SLD plotted as a function of distance from the Si (100) surface. Also included are the SLD values for the close-packed particle layers (gray areas). The dots show the SLD profile assuming zero roughness to aid identification of the distinctive layers, as defined in Figure 3. In the upper right panel the substrate, SiO₂, and OTS layers are indicated as well. Error bars represent the statistical uncertainties propagated through the data normalization and with a one sigma confidence interval.

Inline graphic — Upper left panel: NR () plotted as a function of Q_z for FF25 (5 vol %) measured against hydrophilic (piranha), hydrophobic (OTS), and APTES-coated Si. The solid lines represent fits to the data. Other panels: profile of nuclear SLD plotted as a function of distance from the Si (100) surface. Also included are the SLD values for the close-packed particle layers (gray areas). The dots show the SLD profile assuming zero roughness to aid identification of the distinctive layers, as defined in Figure 3. In the upper right panel the substrate, SiO₂, and OTS layers are indicated as well. Error bars represent the statistical uncertainties propagated through the data normalization and with a one sigma confidence interval.