| 1. | Introduction | 2 |
| 2. | Forced Vibrations, Complex Resonance Frequencies | 6 |
| 3. | Techniques of Read-Out | 8 |
| 3.1. | Oscillator Circuits | 9 |
| 3.2. | Impedance Analysis | 9 |
| 3.3. | Ring-Down | 10 |
| 3.4. | Multi-Frequency Lock-In Amplification | 10 |
| 3.5. | Fast Measurements, Modulation Experiments | 11 |
| 3.6. | Noise and Drift | 13 |
| 4. | The Acoustic Multilayer Formalism and its Consequences | 14 |
| 4.1. | Qualitative Data inspection | 14 |
| 4.2. | The Small-Load Approximation in 1D (Parallel-Plate Model) | 14 |
| 4.3. | Inertial Loading | 17 |
| 4.4. | Semi-Infinite Viscoelastic Media | 17 |
| 4.5. | Films in Air | 21 |
| 4.5.1. | Very Thin Films (Sauerbrey Limit) | 23 |
| 4.5.2. | Infinite Thickness | 23 |
| 4.5.3. | Thin Viscoelastic Films | 23 |
| 4.5.4. | The Film Resonance | 25 |
| 4.6. | Layers Adsorbed from a Liquid Phase | 27 |
| 4.6.1. | General | 27 |
| 4.6.2. | Thin Adsorbates | 28 |
| 4.6.3. | Thick Layers | 32 |
| 4.7. | Viscoelastic Dispersion and High-Frequency Rheology | 33 |
| 4.8. | Slip | 34 |
| 5. | Non-Planar Samples | 35 |
| 5.1. | Point Contacts with Large Objects Clamped in Space by Inertia | 35 |
| 5.2. | Large Amplitudes, Partial Slip | 36 |
| 5.3. | Structured Samples, Numerical Calculations | 40 |
| 5.4. | Roughness | 42 |
| 6. | Coupled Resonances | 43 |
| 6.1. | The Sphere with Moderate Mass | 43 |
| 6.2. | Influence of Rotation on the Frequency Shift | 46 |
| 6.3. | Other Types of Coupled Resonances | 49 |
| 7. | Piezoelectric Stiffening | 50 |
| 8. | Beyond the Parallel-Plate Model | 51 |
| 8.1. | Energy Trapping, Compressional Waves | 51 |
| 8.2. | Anharmonic Sidebands | 54 |
| 8.3. | Towards 3D-Modelling: The Small-Load Approximation in Tensor Form | 55 |
| 8.4. | The 4-Element Circuit and the Electromechanical Analogy | 58 |
| 8.5. | Amplitude of Oscillation, Effective Area | 60 |
| 8.6. | Modal Mass, Sauerbrey Equation for Plates with Energy Trapping | 61 |
| 9. | Combined Instruments | 62 |
| 9.1. | The Electrochemical QCM (EQCM) | 63 |
| 9.2. | Combination with Optical Reflectometry | 63 |
| References | 71 |