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. 2021 May 20;22(10):5401. doi: 10.3390/ijms22105401

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© 2021 by the authors.

Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).

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Electron microscopy techniques. Sample 1 (S1): TEM image (A1), STEM-HAADF image (A2), SAED image (A3), and HRTEM (A4). Sample 2 (S2): TEM image (B1), STEM-HAADF (B2). SAED (selected area electron diffraction) image in B area of B1 (B3) and HR-STEM (bright field) image (B4). Sample 3 (S3): TEM image (C1), STEM-HAADF image (C2), and SAED in areas A and B of C1 image, respectively (C3,C4). Sample 4 (S4): TEM image (D1), HRTEM image (D2), SAED (D3), HR-STEM (bright field) image (D4).