Fig. 2. Morphological analysis of polyUiO-66 derived from pbdc-8a-PEG4k-10%: (a) SEM of bulk crystals; (b and c) TEM of bulk crystals dispersed in methanol. Inset shows the spacing corresponds to UiO-66 crystals; (d) schematic representation of ultramicrotomy process of polyMOF crystals; (e and f) TEM of ultramicrotomed section revealing the layered morphology of polyUiO-66 (white arrows in (e) denote layered assemblies); (g) SAXS scattering profile of the bulk crystals showing a spacing at 4.5 nm; (h) PXRD powder pattern of the bulk material shows the spacing of UiO-66 at 1.2 nm.
