Fig. 5. Morphological analysis of polyUiO-66 derived from pbdc-8a-PEG2k-OMe: (a) SEM of bulk crystals; (b and c) TEM of bulk crystals dispersed in methanol. Inset shows the spacing corresponds to UiO-66 crystals; (d and e) TEM of ultramicrotomed section revealing the layered morphology of polyUiO-66 (white arrows in (d) denote layered assemblies); (f) SAXS scattering profile of the bulk crystals showing a d-spacing of 4.3 nm; (g) PXRD powder pattern of the bulk material shows the spacing of UiO-66 at 1.2 nm.
