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. 2020 Nov 26;15(2):236–241. doi: 10.1055/s-0040-1716781

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European Journal of Dentistry. This is an open access article published by Thieme under the terms of the Creative Commons Attribution-NonDerivative-NonCommercial-License, permitting copying and reproduction so long as the original work is given appropriate credit. Contents may not be used for commercial purposes, or adapted, remixed, transformed or built upon. (https://creativecommons.org/licenses/by-nc-nd/4.0/)

This is an open-access article distributed under the terms of the Creative Commons Attribution-NonCommercial-NoDerivatives License, which permits unrestricted reproduction and distribution, for non-commercial purposes only; and use and reproduction, but not distribution, of adapted material for non-commercial purposes only, provided the original work is properly cited.

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Fig. 2 — Representative scanning electron micrographs of the enamel cross-sections and the elemental mapping at different depths (from surface area A to the deepest area D). EDS detected stronger silicon signals at the surface area (0.56 weight%), which increased right below the mineralized layer formed at the enamel surface (C, 0.77 weight%), and decreased in the deepest area (D, 0.24 weight%). The amounts of sodium, phosphorus, and calcium also varied as a function of the depth.