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. 2021 Mar 19;8(11):2002044. doi: 10.1002/advs.202002044

Figure 9.

Figure 9

a) SIMS depth profile of LFP deposited on metallic Ti showing strong interdiffusion of Ti into the LFP thin film (top) and of suppressed Ti‐diffusion by implementation of a TiN diffusion barrier layer. Reproduced with permission.[ 131 ] Copyright 2015, Elsevier. b) Diffusion coefficient for Li+ determined by EIS in LFP thin films with varying Ag content as function of voltage. Reproduced with permission.[ 128 ] Copyright 2009, Elsevier.