Figure 9.
a) SIMS depth profile of LFP deposited on metallic Ti showing strong interdiffusion of Ti into the LFP thin film (top) and of suppressed Ti‐diffusion by implementation of a TiN diffusion barrier layer. Reproduced with permission.[ 131 ] Copyright 2015, Elsevier. b) Diffusion coefficient for Li+ determined by EIS in LFP thin films with varying Ag content as function of voltage. Reproduced with permission.[ 128 ] Copyright 2009, Elsevier.