AFM	Atomic Force Microscopy
ATR	Attenuated Total Reflectance
BET	Brunauer, Emmett and Teller Analysis
CD	Circular Dichroism
CV	Cyclic Voltammetry
DLS	Dynamic Light Scattering
DRS	Differential Reflectance Spectroscopy
DSC	Differential Scanning Calorimetry
EDS/EDX/EDAX	Energy-Dispersive X-Ray Spectroscopy
EELS	Electron Energy Loss Spectroscopy
ESI-MS	Electrospray Ionisation Mass Spectroscopy
FESEM	Field Emission Scanning Electron Microscopy
FTIR	Fourier-Transform Infrared Spectroscopy
GC-MS	Gas Chromatography-Mass Spectrometry
HRSEM	High Resolution Scanning Electron Microscopy
HRTEM	High Resolution Transmission Electron Microscopy
ICP-OES	Inductively Coupled Plasma-Optical Emission Spectrometry
NAA	Neutron Activation Analysis
NP	Nanoparticle
NTA	Nanoparticle Tracking Analysis
PL	Photoluminescence
SAED	Selected Area Electron Diffraction
SEM	Scanning Electron Microscopy
TEM	Transmission Electron Microscopy
TGA	Thermogravimetric Analysis
UV-vis	Ultra Violet-visible spectroscopy
VSM	Vibrating-Sample Magnetometer
XPS	X-Ray Photoelectron Spectroscopy
XRD	X-Ray Powder Diffraction