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. 2021 Jun 8;13:223–230. doi: 10.2147/CCIDE.S313131

Table 2.

Tukey’s Post Hoc Test Comparing the Failure Modes in Fracture Resistance Among the Study Groups

Group Compared to P value
Digital Die Spacer Thickness 20 microns 40 microns 0.117
100 microns 0.009*
40 microns 100 microns 0.290

Notes: *Indicates a statistically significant difference at p value≤0.05.