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. Author manuscript; available in PMC: 2022 Apr 1.
Published in final edited form as: Macromol Chem Phys. 2021 Apr 5;222(7):2170013. doi: 10.1002/macp.202170013

Figure 7.

Figure 7.

Power spectral density of 30%, 40%, 50%, and 60% MeOH-annealed silk film topographies acquired from AFM data. The data was fitted with the ABC model (Eq.1), shown in the dashed lines, and the fitted A, B, and C coefficients were used to calculate the RMS roughness and correlation length of the film surfaces.